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Control of manufacturing processes

This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization.
Introduction to control of manufacturing processes
Introduction to control of manufacturing processes
Lecture 1 in Control of Manufacturing Processes, MIT. This lecture examines (Introduction to control of manufacturing processes). Terms of use..
Semiconductor process variation
Semiconductor process variation
Lecture 2 in Control of Manufacturing Processes, MIT. This lecture examines (Semiconductor process variation). Terms of use..
Mechanical process variation
Mechanical process variation
Lecture 3 in Control of Manufacturing Processes, MIT. This lecture examines (Mechanical process variation). Terms of use..
Probability models of manufacturing processes
Probability models of manufacturing processes
Lecture 4 in Control of Manufacturing Processes, MIT. This lecture examines (Probability models of manufacturing processes). Terms of use..
Probability models, parametere estimation, and sampling
Probability models, parametere estimation, and sampling
Lecture 5 in Control of Manufacturing Processes, MIT. This lecture examines (Probability models, parametere estimation, and sampling). Terms of use..
Sampling distributions and statistical hypotheses
Sampling distributions and statistical hypotheses
Lecture 6 in Control of Manufacturing Processes, MIT. This lecture examines (Sampling distributions and statistical hypotheses). Terms of use..
Shewhart SPC and process capability
Shewhart SPC and process capability
Lecture 7 in Control of Manufacturing Processes, MIT. This lecture examines (Shewhart SPC and process capability). Terms of use..
Process capability and alternative SPC methods
Process capability and alternative SPC methods
Lecture 8 in Control of Manufacturing Processes, MIT. This lecture examines (Process capability and alternative SPC methods). Terms of use..
Advanced and multivariate SPC
Advanced and multivariate SPC
Lecture 9 in Control of Manufacturing Processes, MIT. This lecture examines (Advanced and multivariate SPC). Terms of use..
Yield modeling
Yield modeling
Lecture 10 in Control of Manufacturing Processes, MIT. This lecture examines (Yield modeling). Terms of use..
Introduction to analysis of variance
Introduction to analysis of variance
Lecture 11 in Control of Manufacturing Processes, MIT. This lecture examines (Introduction to analysis of variance). Terms of use..
Full factorial models
Full factorial models
Lecture 12 in Control of Manufacturing Processes, MIT. This lecture examines (Full factorial models). Terms of use..
Modeling testing and fractional factorial models
Modeling testing and fractional factorial models
Lecture 13 in Control of Manufacturing Processes, MIT. This lecture examines (Modeling testing and fractional factorial models). Terms of use..
Aliasing and higher order models
Aliasing and higher order models
Lecture 14 in Control of Manufacturing Processes, MIT. This lecture examines (Aliasing and higher order models). Terms of use..
Response surface modeling and process optimization
Response surface modeling and process optimization
Lecture 15 in Control of Manufacturing Processes, MIT. This lecture examines (Response surface modeling and process optimization). Terms of use..
Process robustness
Process robustness
Lecture 16 in Control of Manufacturing Processes, MIT. This lecture examines (Process robustness). Terms of use..
Nested variance components
Nested variance components
Lecture 17 in Control of Manufacturing Processes, MIT. This lecture examines (Nested variance components). Terms of use..
Sequential experimentation
Sequential experimentation
Lecture 18 in Control of Manufacturing Processes, MIT. This lecture examines (Sequential experimentation). Terms of use..
Case study 1-Tungsten CVD DOE-RSM
Case study 1-Tungsten CVD DOE-RSM
Lecture 19 in Control of Manufacturing Processes, MIT. This lecture examines (Case study 1-Tungsten CVD DOE-RSM). Terms of use..
Case study 2-cycle to cycle control
Case study 2-cycle to cycle control
Lecture 20 in Control of Manufacturing Processes, MIT. This lecture examines (Case study 2-cycle to cycle control). Terms of use..

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